Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Soft Fault Diagnosis in Analog Circuits Based on Bispectral Models

Yong Deng, Ning Liu

A Novel Noise-assisted Prognostic Method for Linear Analog Circuits

Liyue Yan, Houjun Wang, Zhen Liu, Jingyu Zhou, Bing Long

Three-Stage Optimization of Pre-Bond Diagnosis of TSV Defects

Bei Zhang, Vishwani D. Agrawal

Efficient Techniques for Fault Detection and Correction of Reversible Circuits

Hafiz Md. Hasan Babu, Md. Solaiman Mia, Ashis Kumer Biswas

Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits

Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria

Offline Error Detection in MEDA-Based Digital Microfluidic Biochips Using Oscillation-Based Testing Methodology

Vineeta Shukla, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Noohul Basheer Zain Ali, Krishnendu Chakrabarty

Analysing NBTI Impact on SRAMs with Resistive Defects

M. T. Martins, G. C. Medeiros, T. Copetti, F. L. Vargas, L. M. Bolzani Poehls

New Light Weight Threshold Voltage Defined Camouflaged Gates for Trustworthy Designs

Vijaypal Singh Rathor, Bharat Garg, G. K. Sharma

Novel Method for Nondestructive Body Effect Measurement in Dynamic Random Access Memory

Ilwoo Jung, Bonggu Sung, Byoungdeog Choi

High Speed Error Tolerant Adder for Multimedia Applications

S. Geetha, P. Amritvalli