Ausgabe 1/2021
Inhalt (13 Artikel)
Estimating Operational Age of an Integrated Circuit
Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems
Sabyasachi Deyati, Barry J. Muldrey, Adit D. Singh, Abhijit Chatterjee
Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier
Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm
Karthik Pandaram, S. Rathnapriya, V. Manikandan
On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure
Xijun Huang, Chuanpei Xu, Long Zhang
Testing and Diagnosis of Digital Microfluidic Biochips using Multiple Droplets
Sourav Ghosh, Surajit Kumar Roy, Chandan Giri
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model
Mengru Wang, Jinbo Wang, Jianmin Wang, Shan Zhou
Model Transferability from ImageNet to Lithography Hotspot Detection
Yindong Xiao, Xueqian Huang, Ke Liu
Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip
Partha Mitra, Jaydeb Bhaumik, Angsuman Sarkar