Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Application of Contactless Testing to PCBs with BGAs and Open Sockets

Abdelghani Renbi, Jerker Delsing

A High Performance SEU Tolerant Latch

Zhengfeng Huang, Huaguo Liang, Sybille Hellebrand

Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm

Alfonso Martinez Cruz, Ricardo Barrón Fernández, Herón Molina Lozano, Marco Antonio Ramírez Salinas, Luis Alfonso Villa Vargas

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

Athanasios Dimakos, Haralampos-G. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric De Foucauld

A Novel Built-in Current Sensor for N-WELL SET Detection

H.-B. Wang, R. Liu, L. Chen, J.-S. Bi, M.-L. Li, Y.-Q. Li

A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock Testing

Sindhu Gunasekar, Vishwani D. Agrawal

Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell

Alexandre Simionovski, Rafael G. Vaz, Odair L. Gonçalez, Gilson Wirth

Erratum to: A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator

Kentaroh Katoh, Yutaro Kobayashi, Takeshi Chujo, Junshan Wang, Ensi Li, Congbing Li, Haruo Kobayashi