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Zeitschrift

Journal of Electronic Testing

Journal of Electronic Testing 3/2015

Ausgabe 3/2015

Inhaltsverzeichnis ( 10 Artikel )

01.06.2015 | Ausgabe 3/2015

Editorial

Vishwani D. Agrawal

01.06.2015 | Ausgabe 3/2015

Test Technology Newsletter

01.06.2015 | Ausgabe 3/2015

Contactless Testing of Circuit Interconnects

Abdelghani Renbi, Jerker Delsing

01.06.2015 | Ausgabe 3/2015

A Unified Sequential Equivalence Checking Methodology to Verify RTL Designs with High-Level Functional and Protocol Specification Models

Carlos Ivan Castro Marquez, Marius Strum, Wang Jiang Chau

01.06.2015 | Ausgabe 3/2015

Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch

Marko S. Andjelković, Vladimir Petrović, Zoran Stamenković, Goran S. Ristić, Goran S. Jovanović

01.06.2015 | Ausgabe 3/2015

A Hilbert-Transform-Based Method to Estimate and Correct Timing Error in Time-Interleaved ADCs

Li Wang, Lianping Guo, Jun Jiang, Duyu Qiu

01.06.2015 | Ausgabe 3/2015

A New Approach to Model the Effect of Topology on Testing Using Boundary Scan

Farnaz Fotovatikhah, Bahareh Naraghi, Fatemeh Tavakoli, Mahdiar Ghadiry

01.06.2015 | Ausgabe 3/2015

Distributed Scan Like Fault Detection and Test Optimization for Digital Microfluidic Biochips

Subhamita Mukherjee, Tuhina Samanta

01.06.2015 | Ausgabe 3/2015

One More Class of Sequential Circuits having Combinational Test Generation Complexity

Debesh Kumar Das, Hideo Fujiwara

01.06.2015 | Ausgabe 3/2015

A New On-chip Signal Generator for Charge-Based Capacitance Measurement Circuit

Xiao Peng Yu, Rong Qian Tian, Wen Lin Xu, Zheng Shi

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