Ausgabe 4/2020
Inhalt (12 Artikel)
New Method for Determining and Predicting Test Interconnect Pin Current Carrying Capacity
Eli Gurevich, Pranit Deshmukh
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits
Baojun Liu, Li Cai, Xiaoqiang Liu
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults
Shuo Cai, Binyong He, Weizheng Wang, Peng Liu, Fei Yu, Lairong Yin, Bo Li
Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform
Yong Deng, Ting Chen, Di Zhang
Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems
Q. Huang, J. Jiang, Y. Q. Deng
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-Linearity
Sumit Kumar Jindal, Ritobrita De, Ajay Kumar, Sanjeev Kumar Raghuwanshi
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up Tables
Ayan Palchaudhuri, Anindya Sundar Dhar
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit
Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators
Leonardo B. Piccoli, Renato V. B. Henriques, Tiago R. Balen
Low-Power Area-Efficient Fault Tolerant Adder in Current Mode Multi Valued Logic Using Berger Codes
Shahram Mohammadi, Reza Omidi, Mohammad Lotfinejad