Skip to main content
main-content

Zeitschrift

Journal of Electronic Testing

Journal of Electronic Testing 5/2020

Ausgabe 5/2020

Inhaltsverzeichnis ( 11 Artikel )

22.10.2020 | Ausgabe 5/2020

Editorial

Vishwani D. Agrawal

01.10.2020 | Ausgabe 5/2020

Test Technology Newsletter

22.08.2020 | Ausgabe 5/2020

Tipping Point Analysis of Electrical Resistance Data with Early Warning Signals of Failure for Predictive Maintenance

Valerie N. Livina, Adam P. Lewis, Martin Wickham

19.10.2020 | Ausgabe 5/2020

Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods

Azhaganantham Arulmurugan, Govindasamy Murugesan, Balasubramaniam Vivek

14.10.2020 | Ausgabe 5/2020

Part I: Evaluation for Hardware Trojan Detection Based on Electromagnetic Radiation

Ting Su, Shaoqing Li, Yongkang Tang, Jihua Chen

19.10.2020 | Ausgabe 5/2020

TRAP-GATE: A Probabilistic Approach to Enhance Hardware Trojan Detection and its Game Theoretic Analysis

Sivappriya Manivannan, Lakshmi Kuppusamy, N. Sarat Chandra Babu

21.08.2020 | Ausgabe 5/2020

A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship

Srdjan Djordjevic, Miroljub T. Pesic

23.10.2020 | Ausgabe 5/2020

Design Development and Testing of High Performance Microwave Frequency Up-Converter

Vipin Kumar

26.09.2020 | Ausgabe 5/2020

Formal Verification of ECCs for Memories Using ACL2

Mahum Naseer, Waqar Ahmad, Osman Hasan

13.10.2020 | Ausgabe 5/2020

Soft Computing Techniques Based CAD Approach for Power Supply Noise Reduction in System-on-Chip

Partha Mitra, Angsuman Sarkar

03.10.2020 | Ausgabe 5/2020

Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices

Yury Parfenov, Vladimir Chepelev, Yu-hao Chen, Yan-zhao Xie

Aktuelle Ausgaben