Ausgabe 3/2020
Inhalt (12 Artikel)
Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices
Wendong Wang, Ujjwal Guin, Adit Singh
Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices
Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Gabriella Trucco, Ioana Vatajelu
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic Styles
Sushanth Varada, Swapnil Katpally, Subha Sri Lakshmi Thiruveedhi
Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation
Dongzhe Yu, Han Wang, Jiangtao Xu
A probability density estimation algorithm on multiwavelet for the high-resolution ADC
Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang
Time Complexity Comparison of Stopping at First Failure and Completely Running the Test
Ongun Yucesan, Altan Ozkil
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing
Bharat Garg, Sujit Kumar Patel, Sunil Dutt