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Journal of Electronic Testing

Ausgabe 1/2022

Inhalt (11 Artikel)

Editorial

Vishwani D. Agrawal

Hardware Obfuscation for IP Protection of DSP Applications

Naveenkumar R, N.M. Sivamangai, Napolean A, G. Akashraj Nissi

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies

Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa

A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design

Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang

A New Neural Network Based on CNN for EMIS Identification

Ying-chun Xiao, Feng Zhu, Sheng-xian Zhuang, Yang Yang

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